The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Aug. 30, 2019
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Zhiyuan Xu, Mountain View, CA (US);

Jinyun Yan, Sunnyvale, CA (US);

Kinjal Basu, Sunnyvale, CA (US);

Revant Kumar, Sunnyvale, CA (US);

Onkar A. Dalal, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06K 9/623 (2013.01);
Abstract

Techniques are provided for automatically tuning a parameter in a layered model framework. One or more machine learning techniques are used to train multiple versions of a first model that includes a first version and a second version. A second model is stored that includes a parameter and accepts, as input, output from the first model. Multiple parameter values of the parameter are tested when processing content requests using the first and second versions of the first model. A strict subset of the plurality of parameter values are selected for the parameter of the second model, such that processing a first subset of the content requests using the first version of the first model results in a first value of a particular metric that matches a second value of the particular metric resulting from processing a second subset of the content requests using the second version of the first model.


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