The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Mar. 09, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Harumichi Yokoyama, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2006.01); H04L 67/10 (2022.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/04 (2013.01); H04L 67/10 (2013.01);
Abstract

Provided is a distributed machine learning device which can efficiently converge a plurality of parameters. The distributed machine learning device includes: block configuration determination unit that determines a plurality of configurations of blocks each being a subset of a plurality of parameters used for a prediction model, and acquires a change amount of each subset of parameters belonging to the block, based on a result of executing processing of optimizing the plurality of parameters, and changes an element of the subset of the parameters in the block, based on the acquired change amount.


Find Patent Forward Citations

Yokoyama, Harumichi. (2022). Distributed machine learning device, distributed machine learning method, and distributed machine learning recording medium (U.S. Patent No. 11514359). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11514359

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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