The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Nov. 25, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Aaron K. Baughman, Cary, NC (US);

Gary William Reiss, Buford, GA (US);

Shikhar Kwatra, Durham, NC (US);

Qiqing Christine Ouyang, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G10L 21/0208 (2013.01); G06V 10/764 (2022.01); G10L 15/20 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G10L 15/20 (2013.01); G10L 21/0208 (2013.01);
Abstract

An approach for altering alter training data and training process associated with a neural network to emulate environmental noise and operational instrument error by using the concepts of shots to sample within a squeezed space model, wherein shots are an uncertainty index that is the average of all shots from a sampling, is disclosed. The approach leverages a squeeze theorem to create a squeezed space model based on the regression of the upper and lower bound associated with the environmental noise and instrument error. The approach calculates an average noise index based on the squeezed space model, wherein the index is used to alter the training data and process.


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