The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Nov. 30, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Masaki Kitsunezuka, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G01S 5/02 (2010.01); G06K 9/62 (2022.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
G06K 9/6288 (2013.01); G01S 5/0289 (2013.01); G06N 20/00 (2019.01); H04W 64/003 (2013.01);
Abstract

A sensing system including multiple sensor node devices and an analysis device, wherein: each of the multiple sensor node devices has a sensor that measures a measurement target and acquires data values, a learning unit that, based on the data values, learns a model used to estimate the data values at an installation position of the sensor, and a communication unit that transmits learning result data indicating a learning result from the learning unit; and the analysis device has a spatial analysis unit that estimates a spatial distribution of the data values based on the learning result data from each of the multiple sensor node devices and the installation positions of the respective sensor node devices.


Find Patent Forward Citations

Kitsunezuka, Masaki. (2022). Sensing system, sensor node device, sensor measurement value processing method, and program (U.S. Patent No. 11514277). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11514277

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