The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2022
Filed:
Sep. 25, 2019
Hitachi Industrial Equipment Systems Co., Ltd., Tokyo, JP;
Hitachi Industrial Equipment Systems Co., Ltd., Tokyo, JP;
Abstract
To obtain a printing inspection device that an optimum binarization threshold value in the printing inspection device that captures an image including a two-dimensional code printed by a general-purpose printer such as an ink jet printer, as a multi-level image, creates a binary image from the multi-level image with a predetermined binarization threshold value, and then performs decoding. Before a practical printing inspection is performed, a read test is performed. The read test is performed on one or more inspection samples by binarizing a multi-level image with brightness values for all gradations as a threshold value. A range (maximum value and minimum value) of readable brightness values is obtained, and then a median value between the minimum value and the maximum value is used as a binarization threshold value for a two-dimensional code image in a practical printing inspection.