The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Jan. 22, 2020
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Xin Xiao, Nanjing, CN;

Kang Cheng, Nanjing, CN;

Liang Zhang, Nanjing, CN;

Jian Li, Shenzhen, CN;

Jiyu Pan, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3037 (2013.01); G06F 11/0757 (2013.01); G06F 11/0772 (2013.01); G06F 11/3075 (2013.01); G06F 11/3476 (2013.01); G06F 12/0246 (2013.01); G06F 12/0253 (2013.01);
Abstract

A method includes obtaining a first memory log, where the first memory log includes log information of a plurality of garbage collections, and log information of each garbage collection includes a garbage collection time, and includes at least one of a downtime, memory usage after garbage collection, and memory usage before garbage collection, obtaining, based on log information in a first detection time window, first statistical information corresponding to the first detection time window, and determining, based on the first statistical information corresponding to the first detection time window, an anomaly degree corresponding to the log information in the first detection time window.


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