The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2022
Filed:
Jan. 25, 2022
Dell Products L.p., Round Rock, TX (US);
Ramakanth Kanagovi, Bengaluru, IN;
Guhesh Swaminathan, Chennai, IN;
Saheli Saha, Kolkata, IN;
Jason Fay, Cedar Park, TX (US);
Araiz Baqi, Pflugerville, TX (US);
Sankunny Jayaprasad, Round Rock, TX (US);
Dell Products L.P., Round Rock, TX (US);
Abstract
Techniques described herein relate to a method for performing testing operations for information handling systems. The method includes obtaining a test case from an information handling system; in response to obtaining the test case: obtaining log information associated with the test case from the information handling system; performing data preparation to generate processed subsequences using the log information; applying a plurality of prediction models to the processed subsequences and training data to generate anomalous subsequence predictions; generating ensemble anomaly scores and severity indexes associated with the processed subsequences using the anomalous subsequence predictions and the processed subsequences; making a determination that the ensemble anomaly scores and severity indexes associated with the processed subsequences result in detection of an anomalous subsequence; and in response to the determination: determining a next best test case associated with the anomalous subsequence; and initiating performance of the next best test case.