The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2022
Filed:
Jun. 23, 2021
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Dmitry Tylik, Westborough, MA (US);
Carole Ann Gelotti, Hollis, NH (US);
Nagasimha G. Haravu, Apex, NC (US);
Aharon Blitzer, Shoham, IL;
Alexander Izikson, Gan Yavne, IL;
Yuval Harduf, Yahud, IL;
Alan L. Taylor, Cary, NC (US);
Marina Shem Tov, Hod Hasharon, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Data storage management may include configuring a stretched volume in a metro cluster configuration using a first volume and a second volume both configured as a same logical volume, L; receiving I/O operations at the metro cluster configuration directed to L, wherein the I/O operations include a write operations that are received at a first system of the metro cluster configuration and that write first data to the first volume; viewing values of a metric regarding data replication performed for the first volume to replicate data between systems of the metro cluster configuration for writes directed to the first volume; responsive to said viewing, determining whether the first metric values denote a problem has occurred in the metro cluster configuration at a first point in time; and responsive to determining that the problem has occurred at the first point in time, performing one or more corrective actions.