The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Oct. 23, 2020
Applicants:

Japan Display Inc., Tokyo, JP;

Panasonic Liquid Crystal Display Co., Ltd., Hyogo-ken, JP;

Inventors:

Chikae Matsui, Mobara, JP;

Noboru Kunimatsu, Chiba, JP;

Hidehiro Sonoda, Mobara, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1333 (2006.01); G02F 1/1337 (2006.01); C09K 19/56 (2006.01); G02F 1/1343 (2006.01);
U.S. Cl.
CPC ...
G02F 1/133723 (2013.01); C09K 19/56 (2013.01); G02F 1/13439 (2013.01); G02F 1/133788 (2013.01); G02F 1/134363 (2013.01); B32B 2457/202 (2013.01); C09K 2323/00 (2020.08); C09K 2323/025 (2020.08); C09K 2323/027 (2020.08); C09K 2323/035 (2020.08); G02F 1/133397 (2021.01);
Abstract

An alignment film is given a 2-layer structure comprising a photoalignment film that is photoalignable and a low-resistivity alignment film whose resistivity is smaller than that of the photoalignment film. The photoalignment film is formed by a polyimide whose precursor is polyamide acid alkyl ester, the number molecular weight of the photoalignment film is large, and the stability of alignment of the photoalignment film by photoalignment is excellent. The low-resistivity alignment film is formed by a polyimide whose precursor is polyamide acid, the number molecular weight of the low-resistivity alignment film is small, and the resistivity of the low-resistivity alignment film is small. The 2-layer structure alignment film can be maintaining an excellent photoalignment characteristic, so DC afterimages can be controlled.


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