The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2022
Filed:
Jun. 20, 2018
Euroimmun Medizinische Labordiagnostika Ag, Luebeck, DE;
Helge Pannhoff, Hamburg, DE;
Martin Hagen-Eggert, Luebeck Schleswig-Holstein, DE;
Markus Morrin, Luebeck Schleswig-Holstein, DE;
Matthias Müller, Luebeck Schleswig-Holstein, DE;
Tilman Johannes Sumpf, Luebeck Schleswig-Holstein, DE;
EUROIMMUN Medizinische Labordiagnostika AG, Luebeck, DE;
Abstract
A method and microscopy system are useful for recording an image of a sample region. A laser beam is directed onto the sample region with interface(s). An objective lens facilitates images the laser beam on a focusing point which lies on the optical axis of the objective lens or an axis parallel thereto, and which lies in a focusing plane. The objective lens and the sample region are displaced with respect to one another in relative fashion along the optical axis of the objective lens to different relative displacement positions. Intensity values of the laser beam are captured for a respective relative displacement position. A respective highest intensity value for a respective displacement position, a curve of the highest intensity values, and a reference relative displacement position from at least one maximum of the curve, are determined. Image(s) of the sample region is/are captured at the reference relative displacement position.