The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Apr. 03, 2017
Applicant:

Total SE, Courbevoie, FR;

Inventors:

Jiazuo Zhang, London, GB;

Gavin Henry Graham, Aberdeen, GB;

Assignee:

TOTAL SE, Courbevoie, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G01V 99/00 (2009.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); G06K 9/6257 (2013.01); G06K 9/6277 (2013.01); G06N 3/0454 (2013.01);
Abstract

Disclosed is a method of conditioning one or more parametric models. The method comprises obtaining a plurality of candidate parametric models, each describing a sequence of domains characterising a subsurface region and determining whether each sequence of domains described by one or more of said candidate parametric models is a valid sequence of domains. For each valid sequence of domains, each candidate parametric model describing that valid sequence of domains (or a subset of these models) is conditioned simultaneously, for example by using an Ensemble Kalman Filter or artificial neural network.


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