The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2022
Filed:
Mar. 09, 2017
Shimadzu Corporation, Kyoto, JP;
Tetsuya Kobayashi, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
In the scatter estimation method of the present invention, Step S(first TOF projection data generation) and Step S(non-TOF scatter estimation algorithm) are performed, and Step S(second TOF projection data generation) and Step S(calculation of TOF direction distribution ratio) are performed, and Step S(calculation of TOF scatter projection data) is performed. A distribution ratio is obtained from the second TOF projection data measured in a scattered radiation energy window (low energy window). Since the target of distribution is non-TOF scatter projection data in a reconstruction data energy window (standard energy window), post-distribution TOF scatter projection data is obtained as approximate TOF scatter projection data in the reconstruction data energy window (standard energy window), and scatter estimation can be accurately performed.