The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Mar. 10, 2021
Applicant:

Rolls-royce Plc, London, GB;

Inventors:

Graham Watson, Derby, GB;

Steven D Massie, Derby, GB;

Assignee:

ROLLS-ROYCE plc, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 15/14 (2006.01); F02C 3/04 (2006.01); G01H 1/00 (2006.01); G01M 5/00 (2006.01); G01M 7/00 (2006.01); G01N 29/14 (2006.01); G01N 29/42 (2006.01); G01N 29/46 (2006.01);
U.S. Cl.
CPC ...
G01M 15/14 (2013.01); F02C 3/04 (2013.01); G01H 1/003 (2013.01); G01M 5/0033 (2013.01); G01M 5/0066 (2013.01); G01M 7/00 (2013.01); G01N 29/14 (2013.01); G01N 29/42 (2013.01); G01N 29/46 (2013.01); F05D 2220/32 (2013.01); F05D 2270/334 (2013.01); G01N 2291/0258 (2013.01);
Abstract

An apparatus for detecting a transient event in an operating machine, the apparatus comprising: a controller configured to control performance of the following steps: a measurement step comprising measuring a periodic signal from a machine; a processing step comprising synchronously processing the periodic signal to track the primary frequency; a filtering step comprising removing the primary periodic component and its harmonics from the periodic signal to yield a filtered dataset; an integration step comprising integrating the filtered dataset over the remaining frequencies to yield an integrated dataset representing the periodic energy at frequencies other than the primary frequency and its harmonics; an analysis step comprising identifying a short-term transient in the integrated dataset to identify a transient disruption in the operation of the machine.


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