The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Jun. 30, 2021
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Navid Poulad, San Jose, CA (US);

Rayna Demaster-Smith, Redmond, WA (US);

Georg Klein, Bellevue, WA (US);

Jeffrey Neil Margolis, Seattle, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/24 (2006.01); G01D 21/02 (2006.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G01B 21/24 (2013.01); G01D 21/02 (2013.01); G02B 27/0172 (2013.01); G02B 27/0176 (2013.01); G02B 2027/014 (2013.01); G02B 2027/0132 (2013.01); G02B 2027/0178 (2013.01);
Abstract

The techniques disclosed herein detect sensor misalignments in a display device by the use of sensors operating under different modalities. In some configurations, a near-to-eye display device can include a number of sensors that can be used to track movement of the device relative to a surrounding environment. The device can utilize multiple sensors operating under multiple modalities. For each sensor, there is a set of intrinsic and extrinsic properties that are calibrated. The device is also configured to determine refined estimations of the intrinsic and extrinsic properties at runtime. The refined estimations of the intrinsic and extrinsic properties can then be used to derive knowledge on how the device has deformed over time. The device can then use the refined estimations of the intrinsic and extrinsic properties and/or any other resulting data that quantifies any deformations of the device to make adjustments to rendered images at runtime.


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