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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11511426 B1

PDFFull Text
Date of Patent:
Nov. 29, 2022

Filed:

Apr. 30, 2020

System, method, and apparatus for rapid development of an inspection scheme for an inspection robot

Applicant:

Gecko Robotics, Inc., Pittsburgh, PA (US);

Inventors:

Edward A. Bryner, Pittsburgh, PA (US);

Kevin Y. Low, Pittsburgh, PA (US);

Joshua D. Moore, Pittsburgh, PA (US);

Dillon R. Jourde, Pittsburgh, PA (US);

Francesco H. Trogu, Pittsburgh, PA (US);

Jeffrey J. Mrkonich, Pittsburgh, PA (US);

William J. Pridgen, Pittsburgh, PA (US);

Domenic P. Rodriguez, Pittsburgh, PA (US);

Alexander C. Watt, North Huntingdon, PA (US);

Michael Stephen Auda, Pittsburgh, PA (US);

Logan A. MacKenzie, Penn Hills, PA (US);

Ian Miller, Aspinwall, PA (US);

Samuel Theodore Westenberg, Pittsburgh, PA (US);

Katherine Virginia Denner, Pittsburgh, PA (US);

Benjamin A. Guise, Pittsburgh, PA (US);

Yizhu Gu, Pittsburgh, PA (US);

Todd Joslin, Wexford, PA (US);

Mark J. Loosararian, Pittsburgh, PA (US);

Mark Cho, Pittsburgh, PA (US);

Edwin H. Cho, Pittsburgh, PA (US);

Assignee:

Gecko Robotics, Inc., Pittsburgh, PA (US);

Attorney:

GTC Law Group PC & Affiliates

Primary Examiner:

David L Singer

Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 9/00 (2006.01); B25J 5/00 (2006.01); G05D 1/00 (2006.01); G05D 1/02 (2020.01); B25J 9/10 (2006.01); B25J 19/00 (2006.01); B25J 19/02 (2006.01); G01B 11/06 (2006.01); G01B 11/24 (2006.01); G01B 11/30 (2006.01); G01B 17/02 (2006.01); G01B 17/06 (2006.01); G01B 17/08 (2006.01); G01J 3/50 (2006.01); G01K 13/00 (2021.01); B25J 13/08 (2006.01); B60G 17/015 (2006.01); B60G 17/02 (2006.01); B60G 21/00 (2006.01); B62D 37/04 (2006.01); B62D 57/024 (2006.01); G01M 3/04 (2006.01); G01N 21/88 (2006.01); G01N 27/82 (2006.01); G01N 29/04 (2006.01); G05B 15/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1669 (2013.01); B25J 5/007 (2013.01); B25J 9/0009 (2013.01); B25J 9/0015 (2013.01); B25J 9/102 (2013.01); B25J 9/1602 (2013.01); B25J 9/162 (2013.01); B25J 9/1617 (2013.01); B25J 9/1633 (2013.01); B25J 9/1664 (2013.01); B25J 9/1666 (2013.01); B25J 9/1679 (2013.01); B25J 9/1697 (2013.01); B25J 13/088 (2013.01); B25J 19/0029 (2013.01); B25J 19/02 (2013.01); B60G 17/015 (2013.01); B60G 17/02 (2013.01); B60G 21/002 (2013.01); B60G 21/007 (2013.01); B62D 37/04 (2013.01); B62D 57/024 (2013.01); G01B 11/0616 (2013.01); G01B 11/24 (2013.01); G01B 11/303 (2013.01); G01B 17/025 (2013.01); G01B 17/06 (2013.01); G01B 17/08 (2013.01); G01J 3/50 (2013.01); G01K 13/00 (2013.01); G05D 1/0016 (2013.01); G05D 1/0094 (2013.01); G05D 1/0272 (2013.01); G05D 1/0274 (2013.01); G01M 3/04 (2013.01); G01N 21/88 (2013.01); G01N 27/82 (2013.01); G01N 29/04 (2013.01); G01N 2291/0289 (2013.01); G05B 15/02 (2013.01); G05D 2201/0207 (2013.01);
Abstract

Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.

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