The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Dec. 13, 2018
Applicant:

Auris Health, Inc., Redwood City, CA (US);

Inventors:

Hedyeh Rafii-Tari, Mountain View, CA (US);

Ritwik Ummalaneni, San Mateo, CA (US);

Simon Wei Quan Lim, San Mateo, CA (US);

Prasanth Jeevan, San Mateo, CA (US);

Assignee:

Auris Health, Inc., Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); A61B 34/30 (2016.01); A61B 34/00 (2016.01); A61B 90/00 (2016.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); A61B 34/30 (2016.02); A61B 34/70 (2016.02); A61B 90/361 (2016.02); A61B 2017/00398 (2013.01); A61B 2034/2051 (2016.02); A61B 2034/2055 (2016.02); A61B 2034/2061 (2016.02); A61B 2034/301 (2016.02); A61B 2090/0811 (2016.02); A61B 2090/0818 (2016.02);
Abstract

Systems and methods for estimating instrument location are described. The methods and systems can obtain a first motion estimate based on robotic data and a second motion estimate based on position sensor data. The methods and systems can determine a motion estimate disparity based on a comparison of the first and second motion estimates. Based on the motion estimate disparity, the methods and systems can update a weighting factor for a location derivable from the robotic data or a weighting factor for a location derivable from the position sensor data. Based on the updated weighting factor, the methods and systems can determine a location/position estimate for the instrument. The methods and systems can provide increased accuracy for a position estimate in cases where the instrument experiences buckling or hysteresis.


Find Patent Forward Citations

Loading…