The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Aug. 15, 2019
Applicant:

Leica Biosystems Richmond, Inc., Richmond, IL (US);

Inventors:

Bruce A. Goeckner, Antioch, IL (US);

Heather Renko-Breed, Rockton, IL (US);

Randy Shanahan, Antioch, IL (US);

Assignee:

Leica Biosystems Richmond, Inc., Richmond, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); A61B 10/00 (2006.01); A61B 10/02 (2006.01); B01L 3/00 (2006.01); G01N 1/28 (2006.01); A61B 17/00 (2006.01);
U.S. Cl.
CPC ...
A61B 10/0096 (2013.01); A61B 10/02 (2013.01); B01L 3/508 (2013.01); G01N 1/28 (2013.01); A61B 2010/0225 (2013.01); A61B 2017/00477 (2013.01); B01L 2200/025 (2013.01); B01L 2300/043 (2013.01); B01L 2300/046 (2013.01); B01L 2300/0609 (2013.01);
Abstract

A sample container for use in imaging includes a bottom portion and a wall portion extending upwardly from the bottom portion. The lid overlies the cavity when in the closed position, and a plurality of latches are coupled to the lid and extend substantially orthogonally from the lid. A plurality of recesses are coupled to the wall portion, each recess of the plurality of recesses being adapted and configured to receive one of the plurality of latches. A first alignment structure is within the cavity and is adapted and configured to align a sample lengthwise and widthwise within the cavity such that the sample is aligned relative to an imaging system when the sample container is engaged with the imaging system. A second alignment structure is at least partially within the cavity, and is adapted and configured to align the sample height wise within the cavity.


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