The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Feb. 03, 2020
Applicant:

Nidek Co., Ltd., Aichi, JP;

Inventors:

Shinya Iwata, Aichi, JP;

Megumi Tsuchiya, Aichi, JP;

Yukihiro Higuchi, Aichi, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/12 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/1225 (2013.01); A61B 3/102 (2013.01);
Abstract

A fundus imaging apparatus includes an imaging optical system that irradiates a fundus of a subject eye with light through an objective lens system, and enables to capture a fundus image of the subject eye based on return light from the subject eye, and a diopter correction unit that includes an optical element disposed on an optical path of the imaging optical system and a drive unit driving the optical element, and performs a diopter correction with a diopter value corresponding to a drive amount of the optical element. A drive range of the optical element in the diopter correction unit is set to avoid a specific range being a range in which an artifact caused by reflection light in the objective lens system is maximized.


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