The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
May. 20, 2021
Ipla Holdings Inc., New York, NY (US);
Wei Chen, San Diego, CA (US);
Pascal M. Adjakple, Great Neck, NY (US);
Joseph M. Murray, Schwenksville, PA (US);
Allan Y. Tsai, Boonton, NJ (US);
Lakshmi R. Iyer, King of Prussia, PA (US);
IPLA HOLDINGS INC., New York, NY (US);
Abstract
Measurement modeling and filtering may include configurable cell quality derivation method is used for multi-beam based NR networks; a common measurement model that considers different characteristics of the two measurement signals, NR synchronization signal and additional reference signal; and a multi-level measurement filtering approach that handles different mobility scenarios in an NR network. Measurement configuration and procedures may include a measurement gap design during which UE may use to perform measurements for beam sweeping based NR networks; a group of triggering events that may be used to trigger UE mobility management in an NR network; a content format that may be used for the transmission of UE measurement report; a measurement object design (the object on which a UE may perform the measurements) to reduce UE measurement overhead and cost; and a downlink measurement based inter-cell handover procedure that may be used in an NR network.