The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Dec. 17, 2020
Mediatek Singapore Pte. Ltd., Singapore, SG;
Xuelong Wang, Beijing, CN;
Tao Chen, Beijing, CN;
Nathan Edward Tenny, San Jose, CA (US);
Ming-Yuan Cheng, Hsin-Chu, TW;
Guan-Yu Lin, Hsin-Chu, TW;
MEDIATEK SINGAPORE PTE. LTD., Singapore, SG;
Abstract
Apparatus and methods are provided for sidelink measurement configuration and report for open-loop sidelink power control. In one embodiment, the SL measurement report configuration configures a first measurement report, and wherein the reference threshold is an absolute reference threshold. In another embodiment, the reference threshold is an SL measurement result in an SL measurement report previously sent to the transmitting UE. In some embodiments, the reporting condition is the layer-3 (L3) filtered SL RSRP measurement being the offset higher or lower than the reference threshold. In yet another embodiment, the reporting condition is an explicit request of measurement report from the transmitting UE. In one embodiment, the SL measurement report includes one or more elements comprising a Boolean indicator, a delta value between the L3 filtered SL RSRP measurement and the reference threshold, and an absolute value of the L3 filtered SL RSRP measurement.