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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11508630 B1

PDFFull Text
Date of Patent:
Nov. 22, 2022

Filed:

Sep. 02, 2020

Thin film analyzing device and thin film analyzing method

Applicant:

Kioxia Corporation, Tokyo, JP;

Inventors:

Yuki Wakisaka, Mie, JP;

Yuji Yamada, Mie, JP;

Sho Kato, Mie, JP;

Takumi Nishioka, Mie, JP;

Assignee:

KIOXIA CORPORATION, Tokyo, JP;

Attorney:

Foley & Lardner LLP

Primary Examiner:

Thomas R Artman

Int. Cl.
CPC ...
G01N 23/20025 (2018.01); G01N 23/223 (2006.01); H01L 21/306 (2006.01); H01L 21/66 (2006.01); G01N 23/207 (2018.01); B24B 37/013 (2012.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); B24B 37/013 (2013.01); G01N 23/207 (2013.01); G01N 23/20025 (2013.01); G01N 23/223 (2013.01); H01L 21/30625 (2013.01); H01L 21/67253 (2013.01); H01L 22/26 (2013.01); G01N 2223/052 (2013.01); G01N 2223/607 (2013.01); G01N 2223/6116 (2013.01);
Abstract

A thin film analyzing device includes a processing and analyzing chamber for performing processing and analyzing of a subject having a thin film on a substrate. The processing and analyzing chamber includes a sample holder arranged to hold the subject, an X-ray irradiation source arranged to irradiate the subject with X-rays, a fluorescent X-ray detector configured to detect fluorescent X-rays which are emitted from the subject, a diffracted/reflected X-ray detector configured to detect reflected X-rays and diffracted X-rays which are emitted from the subject, and a substrate remover arranged to remove the substrate.

Find Patent Forward Citations

Wakisaka, Yuki. (2022). Thin film analyzing device and thin film analyzing method (U.S. Patent No. 11508630). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11508630

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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