The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Mar. 23, 2021
Xerox Corporation, Norwalk, CT (US);
Christopher Douglas Atwood, Rochester, NY (US);
Joseph Fredrick Casey, Webster, NY (US);
Frank Tamarez Gomez, Webster, NY (US);
Joseph M. Ferrara, Jr., Webster, NY (US);
Jacob R. McCarthy, Williamson, NY (US);
XEROX CORPORATION, Norwalk, CT (US);
Abstract
A system and method evaluate defects in printed images. A target image, which has been captured of a printed image, is processed to identify defects, where present, which do not occur in a source image from which the printed image was generated. A trained classification model predicts a defect class for respective regions of the target image, each of the defect classes being drawn from a predefined set of defect classes. For at least one of the identified defects, a measure of severity of the defect is determined, such as a size of the defect. A decision on the acceptability of the printed image is made, based on the measure of severity of the at least one defect and the predicted defect class of a respective one of the regions in which the defect occurs.