The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Aug. 13, 2018
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Nodoka Mimura, Tokyo, JP;

Yuji Tsushima, Tokyo, JP;

Kozo Ikegami, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06N 20/00 (2019.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 21/55 (2013.01); G06N 5/02 (2013.01); G06F 2221/034 (2013.01);
Abstract

An analysis apparatus comprises: a processor; and a storage device that stores a prediction model that predicts results for contributing factors of a group of events, wherein the processor executes: a prediction error calculation process in which, on the basis of a first prediction value attained by providing the prediction model with a first appearance frequency for contributing factors of a first event among the group of events, and results corresponding to the first appearance frequency, a prediction error of the first prediction value is calculated; and an error factor extraction process in which, on the basis of a correlation between a second appearance frequency for a contributing factor of a second event among the group of events and the prediction error calculated by the prediction error calculation process, an error factor of the prediction error is extracted from among the contributing factors of the first event.


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