The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Dec. 05, 2018
Applicant:

Here Global B.v., Eindhoven, NL;

Inventor:

Anirudh Viswanathan, Berkeley, CA (US);

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06V 20/10 (2022.01); G06V 20/58 (2022.01); G06V 20/56 (2022.01);
U.S. Cl.
CPC ...
G06K 9/6232 (2013.01); G06K 9/627 (2013.01); G06K 9/6215 (2013.01); G06V 20/182 (2022.01); G06V 20/582 (2022.01); G06V 20/588 (2022.01);
Abstract

An approach is provided for fully-automated learning to match heterogeneous feature spaces for mapping. The approach involves determining a first feature space comprising first features and a second feature space comprising second features, and classified by a feature detector into a first attribution category and a second attribution category, respectively. The approach further involves calculating a first similarity score for the first feature space based on a first distance metric applied to the first features, and a second similarity score for the second feature space based on a second distance metric applied to the second features. The approach also involves determining a transformation space comprising a first weight to be applied to the first similarity score and a second weight to be applied to the second similarity score based on matching the first attribution category and the second attribution category.


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