The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Sep. 03, 2020
General Electric Company, Schenectady, NY (US);
Shaopeng Liu, Clifton Park, NY (US);
Xiao Bian, Santa Clara, CA (US);
Yan Liu, Guilderland, NY (US);
Feng Xue, Clifton Park, NY (US);
Walter Vincent Dixon, III, Duanesburg, NY (US);
Mark Richard Gilder, Clifton Park, NY (US);
Peihong Zhu, Clifton Park, NY (US);
Bernard Patrick Bewlay, Niskayuna, NY (US);
Byron Andrew Pritchard, Cincinnati, OH (US);
Masako Yamada, Niskayuna, NY (US);
Colin James Parris, Brookfield, CT (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method of inspecting a component includes storing at least one inspection image file in a memory and receiving a search request associated with the at least one inspection image file. The method also includes accessing a database including a plurality of image files, comparing the hash code of the at least one inspection image file to the hash code of each image file of the plurality of image files, and identifying a first subset of image files based on the hash code comparison. The method also includes comparing the feature data of the at least one inspection image file to the feature data of each image file of the first subset of image files and classifying a second subset of image files as relevant based on the feature data comparison. The method further includes generating search results based on the second subset of image files.