The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Nov. 10, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Florian Beye, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 11/32 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3452 (2013.01); G06F 11/3051 (2013.01); G06F 11/321 (2013.01); G06F 11/3414 (2013.01); G06F 11/3447 (2013.01); G06F 2201/865 (2013.01);
Abstract

The throughput estimation devicecomprises a storagewhich stores tuples, each including an evaluation formula and parameter data, and a calculation device constructing unitwhich constructs a calculation device according to a configuration including data associated with software processes, data associated with hardware resources, data associated with interconnections between a software process and a hardware resource, and the tuples, wherein the calculation device inputs a load vector describing input information load to the software processes, and outputs a result value.


Find Patent Forward Citations

Beye, Florian. (2022). Throughput estimation device and throughput estimation system (U.S. Patent No. 11507490). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11507490

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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