The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Jan. 20, 2021
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Charles Ma, Beijing, CN;
Shaoqin Gong, Beijing, CN;
Geng Han, Beijing, CN;
Vamsi K. Vankamamidi, Hopkinton, MA (US);
Shuyu Lee, Acton, MA (US);
Ping Ge, Beijing, CN;
Jian Gao, Beijing, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Technology is disclosed for recovering the consistency of a RAID (Redundant Array of Independent Disks) metadata database when data corruption is detected in the RAID metadata database. The RAID metadata database includes super sectors, stage sectors, and a data region. Valid data within the data region is a contiguous set of sectors extending from a head sector to a tail sector. In response to data corruption in one of the two super sectors, a set of pointers contained in the other super sector is used to identify the head sector and tail sector. In response to data corruption in both super sectors, the head sector and tail sector are located based on the contents of the sectors in the data region. Techniques are also disclosed for recovering consistency when the data corruption occurs in the stage sectors and/or data region.