The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Nov. 19, 2021
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Yousheng Liu, Beijing, CN;

Xinlei Xu, Beijing, CN;

Jibing Dong, Beijing, CN;

Xiongcheng Li, Beijing, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01); G06F 11/1004 (2013.01);
Abstract

Techniques involve: writing, when a first disk for dirty page storage has a failure, a first target page description generated by a first node and associated with a first set of target dirty pages of the first node and a second set of target dirty pages of a second node to a first page description storage layer for the first node in a second disk; writing a second target page description generated by the second node and associated with the first set of target dirty pages and the second set of target dirty pages to a second page description storage layer for the second node in the second disk; and restoring, when the failure has been eliminated, the first set of target dirty pages and the second set of target dirty pages in the first disk based on at least one of the descriptions.


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