Identifying non-correctable errors using error pattern analysis

Abstract

Techniques are described for identifying patterns of memory cells in a memory array that are predictive of non-correctable errors ('corruption patterns'). The techniques described herein identify patterns of cell errors that are likely to generate errors that cannot be corrected by an error correction code (ECC). The identification of non-correctable cells is accomplished by identifying a pattern of cell errors storing bit values that deviate from corresponding expected values. The pattern of these memory cells and various combinations of the cells in the pattern are compared to patterns of cells that are known to be correctable using ECC. If the error pattern or one or more of the combinations of erroneous cells in the pattern are not associated with patterns that are correctable via ECC, the error pattern is identified as predictive of a likely uncorrectable error.