The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Apr. 10, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Dazhi Dong, Shanghai, CN;

Binhua Lu, Shanghai, CN;

Shufang Meng, Shanghai, CN;

Xing Chen, Shanghai, CN;

Chen Zhang, Shanghai, CN;

Tongyin Xu, Shanghai, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 9/445 (2018.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 9/44594 (2013.01); G06F 11/3034 (2013.01); G06F 11/3442 (2013.01);
Abstract

Techniques perform storage management. In accordance with such techniques, in response to determining that there is an abnormal process in a process group of an application, and a first size of storage space occupied by the abnormal process exceeds a first threshold, an abnormal process is terminated. A second size of storage space occupied by other processes than the abnormal process in the process group after the abnormal process is terminated is determined. In response to the second size exceeding a second threshold, at least one process in the process group to reduce the second size is terminated, where the at least one process is different from the abnormal process.


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