The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Jun. 02, 2020
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Hironobu Kitajima, Kawasaki, JP;

Miho Murata, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/02 (2006.01); G06N 20/00 (2019.01); A61B 5/316 (2021.01); A61B 5/318 (2021.01);
U.S. Cl.
CPC ...
G06F 1/022 (2013.01); A61B 5/316 (2021.01); A61B 5/318 (2021.01); G06N 20/00 (2019.01);
Abstract

A data generation method by a computer is disclosed. First waveform data including marking information at a first position on a waveform, and acquiring second waveform data are acquired. A transformation function is specified that transforms the first waveform data to reduce the difference between a first value of a time axis for a first characteristic point in the first waveform data and a second value of the time axis for a second characteristic point, in the second waveform data, corresponding to the first characteristic point. Third waveform data are generated, in which the marking information is applied at a second position corresponding to the first position in the first waveform data, the second position being determined by using the transformation function.


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