The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Oct. 08, 2019
Faro Technologies, Inc., Lake Mary, FL (US);
Reinhard Becker, Ludwigsburg, DE;
Martin Ossig, Korntal-Münchingen, DE;
Andreas Ditte, Ludwigsburg, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A method for scanning and measuring using a 3D measurement device is provided. The method includes providing the 3D measurement device having a light emitter, a light receiver and a command and evaluation device. The 3D measurement device is further includes a first near-field communication (NFC) device having a first antenna. A second NFC device having a second antenna is positioned adjacent the 3D measurement device. An NFC link is established between the first NFC device and the 3D measurement device. An identifier is transmitted from the second NFC device to the 3D measurement device. It is determined that the second NFC device is authorized to communicate with the 3D measurement device. Commands are transferred to the 3D measurement device from the second NFC device based at least in part on the determination that the second NFC device is authorized to communicate with the 3D measurement device.