The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Mar. 28, 2017
Hitachi High-tech Corporation, Tokyo, JP;
Akira Masuya, Tokyo, JP;
Hiroko Fujita, Tokyo, JP;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
Abstract
The purpose of the present invention is to embody an inspection device wherein dew condensation in a sample container, in particular, in the lid thereof can be prevented or quickly removed without giving heat shock to a sample in the sample container. For this purpose, provided is an inspection device comprising an isothermal partwhich comprises a rackand maintains a sample containerstoring a sample in a temperature-controlled environment, said sample containercomprising a plate and a lid, a detection partwhich comprises an optical device for observing and inspecting the sample stored in the sample container, and a transportation partwhich transports the sample container from the isothermal part to the detection part and vice versa, wherein at least one of the isothermal part, detection part and transportation part is provided with a member by which the lid of the sample container is held in a state lifted from the plate.