The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Jul. 29, 2021
TH Bioventures, Llc, Memphis, TN (US);
Leif E. Honda, Rye, NH (US);
Phil A Cestaro, Memphis, TN (US);
Jon C Wetzel, Germantown, TN (US);
Songhao Li, Brighton, MA (US);
Arsen Hajian, Brookline, MA (US);
Ronald J Sostek, Waltham, MA (US);
TH Bioventures, LLC, Memphis, TN (US);
Abstract
A system and method for detecting pathogenetic analytes including exciting a large target input area with radiation to produce scattered light to form an input beam, reformatting, with an optical slicer system, the input beam to produce an output beam, dispersing the output beam to produce an output area, capturing excitation data from the output area; and determining, with a processor, a presence of a particular analyte in the input area based on the excitation data. The input area can be greater than 100 micron squared and less than one million microns squared. The optical slicer system can be a high throughput virtual slit system. SERS analysis detects analytes of interest with both high resolution and sensitivity simultaneously, and is applicable for detection of the presence of viruses.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile