The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
May. 13, 2019
The Administrators of the Tulane Educational Fund, New Orleans, LA (US);
Matthew David Escarra, New Orleans, LA (US);
Adam Ollanik, Boulder, CO (US);
THE ADMINISTRATORS OF THE TULANE EDUCATIONAL FUND, New Orleans, LA (US);
Abstract
A method for measuring a refractive index of a medium includes exciting a first antisymmetric resonance of a first metasurface, including a first periodic array of resonators formed on a substrate surface, with illumination incident on the first metasurface at a non-normal incidence angle with respect to the substrate surface, the first metasurface including the medium encapsulating the first periodic array of resonators. The method also includes determining a refractive index of the medium from a first amplitude of a first transmitted signal that includes a portion of the illumination transmitted through the first metasurface.