The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Dec. 12, 2018
Applicant:

Suzhou Institute of Biomedical Engineering and Technology, Chinese Academy of Sciences, Jiangsu Province, CN;

Inventors:

Guohua Shi, Jiangsu Province, CN;

Yi He, Sichun Province, CN;

Feng Gao, Jiangxi Province, CN;

Lina Xing, Jilin Province, CN;

Xin Zhang, Jiangsu Province, CN;

Wen Kong, Shandong Province, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0221 (2013.01); G01M 11/0242 (2013.01); G01M 11/0257 (2013.01);
Abstract

The present invention discloses an aspheric lens eccentricity detecting device based on wavefront technology and a detecting method thereof. The device comprises: an upper optical fiber light source, an upper collimating objective lens, an upper light source spectroscope, an upper beam-contracting front lens, an upper beam-contracting rear lens, an upper imaging detector, an upper imaging spectroscope, an upper wavefront sensor, a lens-under-detection clamping mechanism, a lower light source spectroscope, a lower beam-contracting front lens, a lower beam-contracting rear lens, a lower imaging spectroscope, a lower wavefront sensor, a lower imaging detector, a lower collimating objective lens and a lower optical fiber light source. The present invention achieves non-contact detection, with no risk of damaging the lens, and there is no moving part in the device, so the system reliability and stability are high; and in the present invention, various eccentricity errors in the effective aperture of the aspheric lens can be detected at a time, thereby avoiding errors caused by splicing detection, and also greatly reducing the detection time, thus being applicable to online detection on an assembly line.


Find Patent Forward Citations

Loading…