The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Feb. 08, 2019
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Victor Popescu-Stroe, Bucharest, RO;

Emanuel Stoicescu, Bucharest, RO;

Matthias Boehm, Putzbrunn, DE;

Constantin Crisu, Bucharest, RO;

Uwe Fakesch, Bucharest, RO;

Stefan Jahn, Munich, DE;

Erhard Landgraf, Dresden, DE;

Janis Weidenauer, Mannheim, DE;

Bernhard Winkler, Regensburg, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 19/04 (2006.01); G01L 27/00 (2006.01);
U.S. Cl.
CPC ...
G01L 27/005 (2013.01); G01L 19/04 (2013.01);
Abstract

Examples provide for an apparatus, method, and computer program for comparing the output of sensor cells in an arrangement of sensor cells in an area A, including a set of at least two measurement units. A measurement unit includes at least two sensor cells, wherein at least one sensor cell of at least one measurement unit includes a sensitive sensor cell, which is sensitive with respect to a measured quantity. The sensor cells are intermixed with each other. The apparatus further includes means for selecting output signals of sensor cells of the arrangement and means for determining a measured quantity or determining an intact sensor cell by comparing output signals of different measurement units.


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