The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Dec. 28, 2020
Seiko Epson Corporation, Tokyo, JP;
Takashi Toya, Chino, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
Provided is a measurement device including a spectroscope, a movement mechanism configured to relatively move the spectroscope along a first direction with respect to the measurement target, and one or more processors configured to execute detecting a measurement error indicating that spectroscopic measurement processing by the spectroscope is not executed normally, and controlling the spectroscope and the movement mechanism, in which the one or more processors, when the measurement target is a plurality of color patches arranged along the first direction, cause the spectroscope to execute first measurement processing of measuring light with a specific wavelength set in advance while relatively moving the spectroscope in the first direction to acquire a measured value with respect to the specific wavelength obtained by the first measurement processing and a position of the spectroscope, and when the measurement error is detected, move the spectroscope to a position where an amount of variation of the measured value is greater than or equal to a threshold value in a second direction opposite to the first direction and then move the spectroscope in the first direction.