The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Aug. 27, 2019
Applicant:

Csem Centre Suisse D'electronique ET DE Microtechnique Sa—recherche ET Developpement, Neuchatel, CH;

Inventors:

Benjamin Gallinet, Pratteln, CH;

Giorgio Quaranta, Saint-Louis, FR;

Guillaume Basset, Huningue, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/51 (2006.01); G02B 5/20 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/51 (2013.01); G01J 3/28 (2013.01); G02B 5/201 (2013.01); G02B 5/208 (2013.01);
Abstract

A nano-structured optical wavelength transmission filter is provided. The optical filter includes a patterned substrate on which a high refractive index dielectric waveguide is arranged. A low index dielectric layer is arranged on the high refractive index dielectric waveguide, on which an array of metallic nanostructures is arranged. The layers of the optical filter have conformal shapes defined by a patterned surface of the substrate. An optical filter system includes the optical transmission filter and a detector array fixed to the substrate. A spectrometer includes at least one optical transmission filter and/or at least one said optical transmission filter system, and has a spectral resolution of lower than 30 nm for incident light having a wavelength between 300 nm and 790 nm. A method of fabrication of an optical filter, an optical filter system and a spectrometer is also described.


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