The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Oct. 07, 2019
Applicant:

Fujitec Co., Ltd., Hikone, JP;

Inventors:

Tsutomu Takahama, Hikone, JP;

Shunpei Yamaoka, Hikone, JP;

Ryosuke Matsui, Hikone, JP;

Assignee:

FUJITEC CO., LTD., Shiga, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); B66B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); B66B 5/0087 (2013.01);
Abstract

The present invention provides an elevator encoder diagnostic system and an elevator encoder diagnostic method by which input and output ports are kept from being occupied, functional restriction is suppressed, and abnormalities and malfunctions occurring in encoders provided in a dual-system can be detected. The elevator encoder diagnostic system according to the present invention includes a first encodera and a second encoderb that are provided on a rotary portion of the elevator, a first diagnostic unita connected to the first encoder, and a second diagnostic unitb connected to the second encoder, a first determination unita and a second determination unitb that detect differences between encoder rotation amounts of the respective encoder systems and rotation detection signals of the other encoder systems, and, if a difference therebetween exceeds a predetermined threshold, determines that an abnormality has occurred.


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