The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Oct. 16, 2019
Applicant:

Hitachi-ge Nuclear Energy, Ltd., Hitachi, JP;

Inventors:

Akinori Tamura, Tokyo, JP;

Naoyuki Kouno, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 17/02 (2006.01);
U.S. Cl.
CPC ...
G01B 17/02 (2013.01);
Abstract

An ultrasonic inspection system includes: an ultrasonic sensor including a piezoelectric element and a calibration piece interposed between the piezoelectric element and a subject; and a control device that computes a thickness of the subject, on the basis of a difference between an ultrasonic propagation time of one round trip in the calibration piece and the subject and an ultrasonic propagation time of one round trip in the calibration piece. The calibration piece includes: a propagation portion extending along a surface of the subject, the propagation portion having the piezoelectric element adhering to an end face on one side in a direction in which the propagation portion extends; and a propagation-direction turn portion formed on another side in the direction in which the propagation portion extends, the propagation-direction turn portion having a bottom face in contact with the surface of the subject through a contact medium and an inclined face inclining with respect to a direction vertical to the surface of the subject.


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