The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2022
Filed:
Aug. 31, 2020
Institut National DE LA Recherche Scientifique, Quebec, CA;
The University Court of the University of Glasgow, Glasgow, GB;
Mehedi Islam, Montreal, CA;
Piotr Roztocki, Longueuil, CA;
Michael Kues, Lingen, DE;
Christian Reimer, Brookline, MA (US);
Bennet Fisher, Montreal, CA;
Stefania Sciara, Montreal, CA;
Robin Helsten, Montreal, CA;
Yanbing Zhang, Montreal, CA;
Yoann Jestin, Montreal, CA;
Roberto Morandotti, Montreal, CA;
Abstract
A system and a method for phase extraction of a multi-path interferometer, the method comprising generating a reference signal of a coherence length longer than an arm length difference of the multi-path interferometer; splitting the reference signal into a frequency shifted reference signal and an unshifted reference signal; recombining the frequency shifted reference signal and the unshifted reference signal into a polarization- and frequency-multiplexed reference signal, and feeding the polarization- and frequency-multiplexed reference signal to the multi-path interferometer; detecting frequency shifted and unshifted output signals of the multi-path interferometer; and determining the interferometer phase from the detected signal.