The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2022

Filed:

Aug. 05, 2016
Applicant:

Dionex Softron Gmbh, Germering, DE;

Inventors:

Holger Franz, Woerthsee, DE;

Thomas Wachinger, Altomuenster, DE;

Christian Schmidt, Gilching, DE;

Assignee:

Dionex Softron GMBH, Germering, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 15/16 (2006.01); B01D 15/14 (2006.01); G01N 30/86 (2006.01); G01N 30/34 (2006.01);
U.S. Cl.
CPC ...
B01D 15/166 (2013.01); B01D 15/14 (2013.01); B01D 15/161 (2013.01); G01N 30/86 (2013.01); G01N 30/34 (2013.01);
Abstract

A process for transferring a method from a starting system to a target system in liquid chromatography, in particular in high performance liquid chromatography, is described. A first chromatogram of the method carried out on the starting system is available or determined. The method developed for the starting system is carried out on the target system without any change in its physical parameters, and a second chromatogram is thereby determined. The two chromatograms of the starting system and the target system are compared, and measures for adjusting the physical system parameters of the target system are derived from the deviations.


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