The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Dec. 28, 2021
Applicant:

Kyocera Document Solutions Inc., Osaka, JP;

Inventors:

Rui Hamabe, Osaka, JP;

Kazunori Tanaka, Osaka, JP;

Kanako Morimoto, Osaka, JP;

Takuya Miyamoto, Osaka, JP;

Koji Sato, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); H04N 1/409 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00037 (2013.01); H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00023 (2013.01); H04N 1/00034 (2013.01); H04N 1/00068 (2013.01); H04N 1/00082 (2013.01); H04N 1/4097 (2013.01);
Abstract

The image processing apparatus includes: an abnormality detection unit configured to detect one or more abnormalities included in a target image and an abnormality exclusion processing unit configured to exclude a specific abnormality from the detected one or more abnormalities. In a case in which a detection area of a certain abnormality among the detected one or more abnormalities and a detection area of another abnormality overlap with each other and a type of the certain abnormality and a type of the another abnormality are different from each other, when brightness information of one of the certain abnormality and the another abnormality satisfies a specific condition, the abnormality exclusion processing unit excludes the one of the certain abnormality and the another abnormality from the detected one or more abnormalities.


Find Patent Forward Citations

Loading…