The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Jan. 30, 2019
General Electric Company, Schenectady, NY (US);
Masoud Abbaszadeh, Clifton Park, NY (US);
Walter Yund, Clifton Park, NY (US);
Daniel Francis Holzhauer, Burnt Hills, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A cyber-physical system may have monitoring nodes that generate a series of current monitoring node values over time that represent current operation of the system. A hierarchical abnormality localization computer platform accesses a multi-level hierarchy of elements, and elements in a first level of the hierarchy are associated with elements in at least one lower level of the hierarchy and at least some elements may be associated with monitoring nodes. The computer platform may then determine, based on feature vectors and a decision boundary, an abnormality status for a first element in the highest level of the hierarchy. If the abnormality status indicates an abnormality, the computer platform may determine an abnormality status for elements, associated with the first element, in at least one level of the hierarchy lower than the level of the first element. These determinations may be repeated until an abnormality is localized to a monitoring node.