The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Feb. 15, 2017
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventors:

Heejin Kim, Seoul, KR;

Youngtae Kim, Seoul, KR;

Jiwon Kang, Seoul, KR;

Ilmu Byun, Seoul, KR;

Assignee:

LG ELECTRONICS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/02 (2006.01); H04W 76/11 (2018.01); H04L 5/00 (2006.01); H04W 24/10 (2009.01); H04W 72/04 (2009.01);
U.S. Cl.
CPC ...
H04L 25/0226 (2013.01); H04L 5/0051 (2013.01); H04W 24/10 (2013.01); H04W 72/0446 (2013.01); H04W 76/11 (2018.02);
Abstract

The present invention provides a method for measuring a channel between terminals in a wireless communication system, and a device for the method. Particularly, a method for a first terminal to measure a channel in a wireless communication system may comprise: a step of transmitting, to a base station, a first message requesting sounding reference signal (SRS) configuration information associated with a second terminal; a step of receiving, from the base station, a second message including at least one of the SRS configuration information associated with the second terminal and identification information of the second terminal; a step of receiving at least one SRS from the second terminal, by using an SRS configuration associated with the second terminal identified based on the received second message; and a step of measuring a channel with the second terminal by using the received at least one SRS.


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