The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

Dec. 28, 2020
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Alex W. MacKay, Ottawa, CA;

Priyanth Mehta, Ottawa, CA;

Andrew Kam, Ottawa, CA;

David W. Boertjes, Nepean, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/077 (2013.01); H04B 10/80 (2013.01); H04J 14/02 (2006.01);
U.S. Cl.
CPC ...
H04B 10/0775 (2013.01); H04B 10/80 (2013.01); H04J 14/0221 (2013.01);
Abstract

Systems and methods include responsive to transmission of a power spectral density input into an optical system with one or more probe signals, obtaining first measurements of a performance metric of each of the one or more probe signals at an output of the optical system while the one or more probe signals are moved across a band of optical spectrum; responsive to causing power perturbations across the band, obtaining second measurements of the performance metric of each of the one or more probe signals at the output of the optical system while the one or more probe signals are moved across the band; analyzing the performance metric as a function of power utilizing the first measurements and the second measurements; and utilizing results from the analyzing to optimize the performance metric in the optical system.


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