The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Sep. 25, 2017
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Toshiba Digital Solutions Corporation, Kawasaki, JP;
Jun Ohashi, Ota, JP;
Yumi Ozaki, Kawasaki, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Digital Solutions Corporation, Kawasaki, JP;
Abstract
An abnormality detection device according to an embodiment includes a detector, a remover, and a learner. The detector detects first abnormal data in detection target data which is an abnormality detection target by inputting the detection target data to a first autoencoder which performed learning based on first learning target data which is a learning target. The remover removes data associated with the first abnormal data from the first learning target data to generate second learning target data by inputting the first learning target data to a second autoencoder which performed learning based on the first abnormal data detected by the detector. The learner causes the first autoencoder to perform learning based on the second learning target data generated by the remover.