The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Nov. 07, 2017
Nippon Telegraph and Telephone Corporation, Chiyoda-ku, JP;
Yasuhiro Ikeda, Musashino, JP;
Yusuke Nakano, Musashino, JP;
Keishiro Watanabe, Musashino, JP;
Keisuke Ishibashi, Musashino, JP;
Ryoichi Kawahara, Musashino, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Chiyoda-ku, JP;
Abstract
A device for estimating a cause of an anomaly comprises: a detection unit to detect an anomaly in a detection target based on a learner trained on first numerical vectors obtained from a detection target when the detection target is under a normal condition and second numerical vectors to be obtained from the detection target at multiple time; and a first computing unit to compute, for each metric of a second numerical vector from which an anomaly has been detected, as information for estimating a metric of cause of the anomaly, a value obtained by subtracting, from a value of the metric, an average of the metric in the first numerical vectors, and dividing a result of the subtracting by standard deviation of the metric in the first numerical vectors. This device supports estimation of the cause of an anomaly detected in a target object for detecting an anomaly.