The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2022
Filed:
Apr. 27, 2022
Sas Institute Inc., Cary, NC (US);
Xilong Chen, Chapel Hill, NC (US);
Yang Zhao, Milpitas, CA (US);
Sylvie T. Kabisa, Morrisville, NC (US);
David Bruce Elsheimer, Clayton, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
One example described herein involves a system receiving task data and distribution criteria for a state space model from a client device. The task data can indicate a type of sequential Monte Carlo (SMC) task to be implemented. The distribution criteria can include an initial distribution, a transition distribution, and a measurement distribution for the state space model. The system can generate a set of program functions based on the task data and the distribution criteria. The system can then execute an SMC module to generate a distribution and a corresponding summary, where the SMC module is configured to call the set of program functions during execution of an SMC process and apply the results returned from the set of program functions in one or more subsequent steps of the SMC process. The system can then transmit an electronic communication to the client device indicating the distribution and its corresponding summary.